ParticleTrack G400 - 纵览 - 梅特勒托利多

ParticleTrack G400

在实验室中研究颗粒粒径和粒数

采用 FBRM 技术 的 ParticleTrack G400 是直接插入到实验室反应器中的探头式仪器,以便在全工艺过程浓度下实时追踪颗粒粒径及粒数变化。 随着实验条件的变化,持续监测颗粒、颗粒结构和液滴为科学家提供足够证据以获得具有所需属性的一致颗粒。

颗粒粒径与粒数直接影响多相工艺中的性能,包括结晶、乳化和絮凝。 通过实时监测颗粒粒径与粒数,科学家能够使用基于证据的方法自信地了解、优化和放大实验过程。

在为离线分析进行采样和制备时,颗粒可能发生变化。 通过追踪过程中自然存在的颗粒的粒径与粒数的变化,科学家能够安全且无延迟地了解工艺过程 – 甚至是在极端温度与压力条件下。

随着实验条件的变化,通过连续监测颗粒,能够确定过程参数对颗粒粒径和粒数的影响。 这种独特的信息可用于设计能够持续提供具有优化特性的颗粒的过程。

ParticleTrack G400
拨打电话询价

实验室中 ParticleTrack G400 的常见应用包括:

ParticleTrack G400 的主要特征:

ParticleTrack G400 比以前的梅特勒托利多 Lasentec FBRM 技术(S400 和 D600)有了重大改进。

规格 - ParticleTrack G400
测量范围
0.5 – 2000μm
0.5-2000um
温度范围(主机/现场装置)
5 至35°C
主机说明
实验室主机
基座尺寸 (长x高x宽)
492 mm x 89 mm x 237 mm
认证
CE 认证, 1 类激光, NRTL 认证, CB Scheme 认证
电源要求
100-240VAC, 50/60Hz, 1.2A
适用于
实验室: EasyMax/OptiMax
软件
iC FBRM
扫描系统
电子扫描仪
扫描速度
2m/s (19mm探头为1.2m/s)
弦长选择方法(CSM)
Primary(精细)和 Macro(粗糙)
探头直径
19mm探头
9.5mm
14/9.5mm
探头浸湿长度
400mm (用于 19mm 探头)
206mm (用于 14/9.5mm 探头)
91mm (用于 9.5mm 探头)
探头浸湿合金
C22
测量视窗
蓝宝石
标准窗口封条
Kalrez® (标准 19mm)
TM(标准 14/9.5 )
TM(标准9.5,14/9.5)
探头/窗口选件
TM 窗口(用于19mm 探头的选件)
额定压力(探头)
高达 100barg (自定义)
3barg (标准)
额定温度(探头)
+10 至 90°C (标准)
-10 至 90°C (Kalrez 和清洗)
-80 至 90°C (TM 和清洗)
导管长度
3m [9.8ft]
空气要求
清洗歧管的最大出口压力: 0.8barg [12psig]
清洗歧管的最大入口压力: 8.6barg [125 psig]
低流量清洗(使用以避免冷凝物)
最大 流量: 5NL/min [0.2SCFM]
ParticleTrack型号
ParticleTrack G400

除以上标准配置外,我们也可为您提供定制服务

  • 实时研究颗粒粒径与粒数
    科学家将 ParticleTrack 探头直接插入到过程流体中,以长时间连续监测颗粒粒径与粒数,而无需采样。 这种独特的信息成为有效了解涉及晶体、颗粒和液滴的过程的基础。

  • 借助 ParticleTrack将过程与颗粒系统相关联
    ,科学家可以定期确定过程参数如何影响颗粒系统。 可以确定过程参数对生长、团聚、破损和形状变化等机制的影响,从而可以使用基于证据的方法对过程进行优化和改进。

  • 创建符合目的的颗粒系统
    科学家使用 ParticleTrack 来确定如何稳定得到所需粒径和粒数的颗粒产品。 在研发、中试到投入生产的过程中,通过选择较佳的过程参数,科学家可以以较低的总成本快速向市场提供高品质的颗粒产品。

  • 监测并纠正过程偏差
    ParticleTrack 用于对生产中的既定过程进行监测、故障排除和改进。 可以安全地监测难以采样的复杂过程,确保一致地生产质量尽可能较高的颗粒。

具有 FBRM 技术的 ParticleTrack G400 未针对存在爆炸危险的位置进行评级。

文件记录

Documentation for ParticleTrack G400 with FBRM Technology

Data Sheets

ParticleTrack G400 Datasheet
Insert into lab reactors to track changing particle size and count in real time at full process concentrations.

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附件

Upgrade to G400

ParticleTrack G400 Upgrade

ParticleTrack G400 represents a significant improvement over previous METTLER TOLEDO Lasentec FBRM technologies (S400 and D600).

Stuck Particle Correction Improves Consistent and Reliable Measurement - ParticleTrack can distinguish between particles stuck on the probe window and those moving in the process. These stuck particles can be removed from the data ensuring a consistent and reliable measurement for more experiments.

ParticleTrack G400
Figure 1: Comparison of measured chord length distribution for legacy Lasentec FBRM vs. ParticleTrack with FBRM technology.
ParticleTrack G400
Figure 2: Example of legacy Lasentec FBRM instrument failing to observe bimodal distribution of large and small particles, while ParticleTrack displays higher resolution measurement of both particle sizes.

Improved Measurement Accuracy and Resolution - ParticleTrack uses state-of-the art digital signal processing methods to measure particle size with increased accuracy and resolution. These changes mean the measurement matches particle measurements such as laser diffraction and imaging more closely.

Wider Dynamic Range To Detect Critical Process Events - ParticleTrack measures changes in particle count to accurately eliminate concentration-related artifacts from the data and ensure improved sensitivity to changes in the particle system at higher concentrations.  This allows critical process events to be detected that may previously have gone unobserved.

ParticleTrack G400
Figure 3: Example of ParticleTrack identifying a secondary nucleation event at the end of a process while at high concentration.
ParticleTrack G400
Figure 4: Interchangeable probe configurations for the same instrument are shown.

Interchangeable Probes Decrease Costs and Increase Range of Scales - Lab-based ParticleTrack instruments are now available with different sized probes that can be easily changed by the user.  This improves serviceability and increases the range of scales where the same instrument may be used at an overall lower cost.

Two Measurements Acquired Simultaneously To Eliminate Need for Prior System Information or Trial Experimentation - ParticleTrack now collects two datasets simultaneously that are optimized for different types of particle systems. This eliminates the need for any a prior system information or trial experimentation to determine the optimal measurement method.

Improved Instrument to Instrument Repeatability - ParticleTrack technology was developed to ensure different lab and production instruments now measure much more closely, allowing changes in scale of measurement to be decoupled from differences in the probe used to measure them.

ParticleTrack G400
Figure 5: Simultaneous measurement using two different modes using ParticleTrack: Primary is sensitive to the primary particles while Macro is sensitive to overall particle structure.


Voice of User

Senaputra, A., Jones, F., Fawell, P. D. and Smith, P. G. (2014), Focused beam reflectance measurement for monitoring the extent and efficiency of flocculation in mineral systems. AIChE J., 60: 251–265. doi: 10.1002/aic.14256.

      "The [ParticleTracK]G400 also captures bimodal character in unweighted chord distributions, producing distinct peaks for aggregates and fines after suboptimal flocculation; such peaks are rarely well resolved in older FBRM".

      "…the chord length measurement principle applied with the G400 probe leads to an enhanced sensitivity to species at the lower end of the measurement range relative to previous generation FBRM…"

      "The mean square-weighted chord lengths reported from older generation FBRM for flocculated minerals are typically under 400 mm, and yet the naked eye can see much larger aggregates being formed in thickener feedwells. The G400 probe consistently measures larger chord lengths, and this is seen as a significant advantage"

George Zhou, Aaron J Moment, James F. Cuff, Wes A. Schafer,Charles Orella, Eric Sirota, Xiaoyi Gong, and Christopher J. Welch, Process Development and Control with Recent New FBRM, PVM, and IR. Org. Process Res. Dev., Just Accepted Manuscript, Publication Date (Web): 10 Jun 2014.

"Process analytical technologies (PATs) have played an important role in process development and optimization throughout the pharmaceutical industry. Recent new PATs, including in-process video microscopy (PVM), a new generation of focused-beam reflectance measurement (FBRM), miniature process IR spectroscopy, and a flow IR sensor, have been evaluated, demonstrated, and utilized in the process development of many drug substances. First, PVM has filled a technical gap by providing the capability to study morphology for particle engineering by visualizing particles in real time without compromising the integrity of sample. Second, the new FBRM G series has closed gaps associated with the old S series with respect to probe fouling, bearing reliability, data analysis, and software integration. Third, a miniaturized process IR analyzer has brought forth the benefits of increased robustness, enhanced performance, improved usability, and ease of use, especially at scale-up".

Support

Hardware Manuals

Quick Reference Guides

Positioning a ParticleTrack or ParticleView Probe
ParticleTrack probes use Focused Beam Reflectance Measurement (FBRM) technology to track the rate and degree of change to particles and particle struc...
Changing ParticleTrack G400 Interchangeable Probe Tips
This Quick Reference shows you how to quickly replace a ParticleTrack with FBRM G400 interchangeable probe tip and set the software to recognize the n...
Using the Purge Controller for ParticleTrack G400 or ParticleView V19
The Purge Controller is an optional accessory that can be purchased for use with ParticleTrack G400 and ParticleView V19. Purging is required where...

Additional Help

ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...

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软件

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ParticleTrack G400